学术报告

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12月29日学术报告通知

作者: 来源:办公室 发布时间:2014年12月29日 00:00 点击次数:[]

 

报告人

Jeanmichel LeFloch

单位

西澳大利亚大学

报告时间

122915:00

报告地点

三楼会议室

报告题目

From HIGH-Q resonant structures

for metrology applications to quantuminterfacing

报告内容

摘要

In the telecommunication systems, the microwave devices with dielectric resonators are critical devices. Indeed, the dielectric resonators have the advantage of being compact, stable in temperature, and to have a high unloaded quality factor. Thanks to the development of new very low loss dielectric materials with very good electric and thermal characteristics, the use of the dielectric resonators in the high frequencies systems have undergone a rapid development. For instance, a great number of applications have seen their performances improve1-3 considerably like the filters, the oscillators, etc….

报告人

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